Test E: The Instrument Cluster (IC) Does Not Respond to the Scan Tool

PINPOINT TEST E: THE INSTRUMENT CLUSTER (IC) DOES NOT RESPOND TO THE SCAN TOOL

Normal Operation
The instrument cluster (IC) communicates with the scan tool through the high speed controller area network (HS-CAN). Circuits VDB04 (WH/BU) (HS-CAN +) and VDB05 (WH) (HS-CAN -) provide the network connection to the IC. The IC shares the HS-CAN with the PCM, the restraints control module (RCM), the occupant classification system module (OCSM), the 4X4 control module, and the SJB. Voltage is supplied by circuits SBP33 (RD), CBP09 (VT/GY) and CBP10 (YE/OG). Ground is supplied by circuits GD161 (BK/YE) and GD174 (BK/WH).

This pinpoint test is intended to diagnose the following:
- Fuse
- Wiring, terminals or connectors
- IC

E1-E2:

E3-E5: