Pinpoint Test C: The Instrument Cluster (IC) Does Not Respond To The Scan Tool

Communications Network


Pinpoint Test C: The Instrument Cluster (IC) Does Not Respond To The Scan Tool

Refer to Wiring Diagram Set 14, Module Communications Network for schematic and connector information. Diagrams By Number

Refer to Wiring Diagram Set 60, Instrument Cluster for schematic and connector information. Diagrams By Number

Normal Operation

The Instrument Cluster (IC) communicates with the scan tool through the High Speed Controller Area Network (HS-CAN). Circuits VDB04 (WH/BU) (HS-CAN +) and VDB05 (WH) (HS-CAN -) provide the HS-CAN connection to the IC and circuits VDB06 (GY/OG) (MS-CAN +) and VDB07 (VT/OG) (MS-CAN -) provide the Medium Speed Controller Area Network (MS-CAN) connection to the IC. Voltage for the IC is provided by circuits CBP29 (WH/VT) and SBP26 (YE/RD). Circuit GD133 (BK) provides ground.

This pinpoint test is intended to diagnose the following:

- Fuse
- Wiring, terminals or connectors
- IC



PINPOINT TEST C: THE IC DOES NOT RESPOND TO THE SCAN TOOL

NOTICE: Use the correct probe adapter(s) when making measurements. Failure to use the correct probe adapter(s) may damage the connector.

NOTE: Failure to disconnect the battery when instructed will result in false resistance readings. Refer to Battery.

C1-C3:

C3-C5:

C5-C6: